The AFM tip can be used as a sensitive force sensor. The force is measured by recording the deflection (vertical bending) of the cantilever. By performing force versus tip-sample distance curves, mechanical properties at the nanoscale can be studied:
Elastic moduli of thin films and membranes
Indentation
Adhesion measurement
Measurement of surface/surface interactions (Van der Waals, electrostatic, …)
Applications
Image of immobilized catanionic polyhedra in liquid
Force distance curves obtained on the apex and the face
Laboratoire de Physique de l'Etat Condensé -
Institut de Recherche en Ingénierie Moléculaire et Matériaux Fonctionnels
Faculté du Maine - Université du Maine -
Avenue Olivier Messiaen
72085 Le Mans cedex 09, France
