Principle

In contact mode, AFM tip and sample are always in contact. The vertical deflection of the cantilever Dx is directly proportional to forces acting on the tip, according to Hooke ’s law,

Lateral Force Microscopy (LFM) which is also a contact mode, consists in studying the lateral deflection of the cantilever during the scanning of the surface. Differences of friction on the surface can therefore evidenced.

Contact mode animation

Contact mode image of facetted hollow vesicles adsorbed on modified silicon substrates

LFM image of gold nanoparticules evaporated on a mica surface
(Image courtesy of L.V. Kulikova)